TY  - BOOK
AU  - Echlin,Patrick
TI  - Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis
SN  - 0387857303 (acid-free paper)
PY  - 2009///
CY  - New York
PB  - Springer
KW  - Scanning electron microscopy
KW  - Technique
KW  - X-ray microanalysis
N1  - Includes bibliographical references (p. 317-322) and index; Sample collection and selection -- Sample preparation tools -- Sample support -- Sample embedding and mounting -- Sample exposure -- Sample dehydration -- Sample stabilization for imaging in the SEM -- Sample stabilization to preserve chemical identity -- Sample cleaning -- Sample surface charge elimination -- Sample artifacts and damage -- Additional sources of information
ER  -