Scanning force microscopy : with applications to electric, magnetic and atomic forces / Dior Sarid.

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Material type: Text

TextSeries: Oxford series in optical and imaging sciences; 5Publication details: New York : Oxford University Press, 1994Edition: Revised editionDescription: 263p. : ill. ; 24cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode
Book	MAIN LIBRARY Main Library	MAIN LIBRARY Main Library	QH212 . S32S27 1994 (Browse shelf(Opens below))	1	Available		1000024880

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