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Characterization in silicon processing / edited by yale Strusser.

Contributor(s): Material type: TextTextSeries: Materials characterization seriesPublication details: Boston : Butterworth Heinemann, 1993Description: 240p. : ill. ; 24cmISBN:
  • 0750691727
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Item type Current library Home library Call number Copy number Status Date due Barcode
Book Book MAIN LIBRARY Main Library MAIN LIBRARY Main Library QC611.8 . S5C48 (Browse shelf(Opens below)) 1 Available 1000021263

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