Influence of temperature on microelectronics and system reliability / Pradeep Lall, Michael G. Pecht, Edward B. Hakim.

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Material type: Text

TextSeries: The electronic packaging seriesPublication details: Boca Raton, Flu : CRC Press, 1997Description: 307p. : ill. ; 26cmISBN:

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Holdings
Item type	Current library	Home library	Call number	Copy number	Status	Date due	Barcode
Book	MAIN LIBRARY Main Library General Collection	MAIN LIBRARY Main Library General Collection	TK7870.25 . L35 (Browse shelf(Opens below))	1	Available		1000047943

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